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Jean-Claude Souyris

About author

Jean-Claude Souyris received an Engineering degree in Electronics from ENSEEIHT, Toulouse, France (1989) and the Ph.D degree from the Université Paul Sabatier, Toulouse (1992). He was a visiting scientist at MIT in 1994 before joining the CNES, Toulouse, in 1997, where he is currently head of the altimetry and radar department. He has authored or co-authored numerous articles dedicated to radar image processing, radar polarimetry and radar altimetry. He is an IEEE member, and Associate Editor for Geoscience and Remote Sensing Letters.

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